Polaroid X-Ray measuring application

Polaroid X-Ray Application

Developed in collaboration for a customer-focused application. The application's purpose was to internally inspect Polaroid film using X-ray analysis.
Using the X-Ray method, a 3D reconstruction of the film structure was made, allowing the layer thickness of the various film components to be accurately mapped.

This approach provided valuable insights into the internal structure of the film, without physically damaging the film, thus contributing to rapid quality control and further optimization of the production process.